Probe #97a7b1d3c7 of ASRock B250M Pro4 Desktop Computer

Log: smartctl

/dev/nvme0n1 smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.10.6-zen1-1-zen] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: Samsung SSD 970 EVO 250GB Serial Number: -- Firmware Version: 2B2QEXE7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 250,059,350,016 [250 GB] Unallocated NVM Capacity: 0 Controller ID: 4 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 250,059,350,016 [250 GB] Namespace 1 Utilization: 237,116,915,712 [237 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Sun Aug 25 14:14:40 2024 CEST Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x03): S/H_per_NS Cmd_Eff_Lg Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 84 Celsius Critical Comp. Temp. Threshold: 84 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 6.20W - - 0 0 0 0 0 0 1 + 4.30W - - 1 1 1 1 0 0 2 + 2.10W - - 2 2 2 2 0 0 3 - 0.0400W - - 3 3 3 3 210 1200 4 - 0.0050W - - 4 4 4 4 2000 8000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 31 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 3,076,651 [1.57 TB] Data Units Written: 5,110,297 [2.61 TB] Host Read Commands: 48,944,845 Host Write Commands: 31,252,738 Controller Busy Time: 112 Power Cycles: 1,542 Power On Hours: 2,394 Unsafe Shutdowns: 319 Media and Data Integrity Errors: 0 Error Information Log Entries: 1,236 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 31 Celsius Temperature Sensor 2: 31 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS Message 0 1236 0 0x0004 0x4004 - 0 0 - Invalid Field in Command Self-test Log (NVMe Log 0x06) Self-test status: No self-test in progress No Self-tests Logged /dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.10.6-zen1-1-zen] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 750 EVO 120GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: MAT01B6Q User Capacity: 120,034,123,776 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Aug 25 14:14:40 2024 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 64) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 098 098 000 - 5176 12 Power_Cycle_Count -O--CK 097 097 000 - 2506 177 Wear_Leveling_Count PO--C- 088 088 000 - 58 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 099 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 071 048 000 - 29 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 511 241 Total_LBAs_Written -O--CK 099 099 000 - 12529325900 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 28/40 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 4294967295/4294901760 SMART Status: 0xffff (Reserved) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (14) Index Estimated Time Temperature Celsius 15 2024-08-24 17:00 ? - ... ..(111 skipped). .. - 127 2024-08-25 11:40 ? - 0 2024-08-25 11:50 40 ********************* 1 2024-08-25 12:00 29 ********** 2 2024-08-25 12:10 29 ********** 3 2024-08-25 12:20 28 ********* 4 2024-08-25 12:30 29 ********** 5 2024-08-25 12:40 29 ********** 6 2024-08-25 12:50 28 ********* 7 2024-08-25 13:00 28 ********* 8 2024-08-25 13:10 28 ********* 9 2024-08-25 13:20 29 ********** 10 2024-08-25 13:30 28 ********* 11 2024-08-25 13:40 28 ********* 12 2024-08-25 13:50 28 ********* 13 2024-08-25 14:00 29 ********** 14 2024-08-25 14:10 30 *********** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 3852 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC


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